Surface analyses of solid samples

Highly surface sensitive techniques (first nanometers)

Surface elemental composition as well as chemical bonding at global and local scales

High sensitivity technique allows grain boundary characterisation

Thin films (nm range) can be measured by various techniques


Some available tools:

  • Scanning Auger Microscope
  • X-Ray Photoelectron Spectroscopy
  • with in-situ preparation chamber and glove box
  • High temperature wettability
  • Liquid wettability and surface tension
  • ToF-Secondary Ion Mass Spectrometry
  • Raman Microscopy and spectroscopy
  • XRF coating measurements
  • Atomic Force Microscopy
  • Ellipsometry, X-Ray reflectivity
  • C,S combustion