Surface analyses of solid samples | CRM Group

Surface analyses of solid samples

Highly surface sensitive techniques (first nanometers)

Surface elemental composition as well as chemical bonding at global and local scales

High sensitivity technique allows grain boundary characterisation

Thin films (nm range) can be measured by various techniques

Some available tools:

Scanning Auger Microscope
X-Ray Photoelectron Spectroscopy
with in-situ preparation chamber and glove box
High temperature wettability
Liquid wettability and surface tension
ToF-Secondary Ion Mass Spectrometry
Raman Microscopy and spectroscopy
XRF coating measurements
Atomic Force Microscopy
Ellipsometry, X-Ray reflectivity …
C,S combustion